Epsilometer - Dielectric Materials Measurement

dielectric-materials-measurement cht




   Epsilometer - Dielectric Materials Measurement


Epsilometer solution for measuring the dielectric properties of materials measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick.
CMT R60 Vector Reflectometer

  • Frequency range: 10 MHz to 6 GHz
  • Impedance: 50 Ohm    
Epsilometer Applications 

Epsilometer can be used in design and manufacturing of microwave circuit materials, antenna radomes, antenna substrates, packaging for wireless devices – 4G/LTE, WiFi, Bluetooth, 5G, IoT, etc. – and many other applications.









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Jason Lin,
2018年12月4日 下午10:29
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Jason Lin,
2018年12月4日 下午10:17
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Jason Lin,
2018年12月4日 下午10:25
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